Particles Size Standards

A wide range of certifiedparticle size standards for validating and calibrating particle sizing instruments or methods in order tocomply with ISO, GMP, GLP and other international standards. They are traceable to certified reference materials from the National Institute of Standards and Technology (NIST) and other international standard organisations through an unbroken chain of measurement leading back to the standard meter.They are available as uniform spheres of polymer, glass or silica in a range of discrete sizes from 20 nanometers (nm) to 2000 micrometers (μm or microns). Spheres are used instead of irregularly shaped particles to minimize shape effects on the response of analytical systems. 

 Applications

• Instrument calibration, development and testing of particle sizers, particle counters
• Instrument QC: check for instrument problems and shifts in laser function, check the calibration curve shape, etc.
• Equipment efficiency studies: vial cleaning, contamination studies, filter testing (including filter leaks), broad distribution material analysis
• Spacers: liquid crystal displays, precision microelectronics

Highly uniform polystyrene spheres calibrated within a billionths of a meter (nanometers) with NIST traceable methodology.


Available in: 20 – 900 nm 

Applications:
– Instrument calibration
– Microscopy, light scattering studies and colloidal systems research
– Checking various sizes of bacterial, viral, ribosomal and sub-cellular components

 

These opaque 8000 Series Duke Standards beads provide more contrast than polymer beads in optical and electron beams.

Available in: 0.5 μm – 1.6 μm

Applications:
– Instrument calibration, microscopy, light scattering studies, colloidal systems research.

Dri-Cal particles are used for calibrating particle sizing and counting instrumentation that require dry particles.

 

Available in: 5 to 100µm

 

Applications:
– Calibration of airborne optical particle counting instruments
• Aerosol studies

Surf-Cal simplifies the job of preparing calibration wafers in your facility.

 

Available in Certified Peak Diameter: 0.047 μm to 3.04 μm

 

Applications:
– Wafer particle deposition
– Prepare calibration wafers for testing Scanning Surface Inspection Systems used in semiconductor manufacturing

These beads can calibrate airborne optical particle counters (OPC) in compliance with ISO 21501-4

 

Available in diameter: 3 μm to 10 μm

 

Applications:
– Calibrate airborne optical particle counters in pharmaceutical and electronic manufacturing labs and cleanrooms